Dielectric relaxation of Ba0.7Sr0.3TiO3 thin films from 1 mHz to 20 GHz

Autor:	David E. Kotecki, P. R. Duncombe, Q. Y. Ma, Timothy M. Shaw, Robert B. Laibowitz, H. Shen, J. D. Baniecki, Deborah A. Neumayer
Rok vydání:	1998
Předmět:	Permittivity Materials science Physics and Astronomy (miscellaneous) business.industry Dielectric Capacitance Nuclear magnetic resonance K band Dispersion (optics) Optoelectronics Relaxation (physics) Dielectric loss Thin film business
Zdroj:	Applied Physics Letters. 72:498-500
ISSN:	1077-3118 0003-6951
DOI:	10.1063/1.120796
Popis:	The dielectric relaxation of Ba0.7Sr0.3TiO3 thin films was investigated up to K band (20 GHz) using time domain and frequency domain measurements. Our results show that from 1 mHz to 20 GHz, the dielectric relaxation of the complex capacitance of Ba0.7Sr0.3TiO3 thin films can be understood in terms of a power law dependence known as the Curie–von Schweidler law. The small dispersion (less than 7% decrease in capacitance from 1 mHz to 20 GHz) and low loss (loss angle less than 0.006 at 20 GHz) measured in Ba0.7Sr0.3TiO3 thin films indicate that these films are applicable to device application up to at least K band.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e5c0b798f416b6fdd4b6c188cc9af3df https://doi.org/10.1063/1.120796 Zobrazit plný text záznamu