Influence of ultrathin chromium adhesion layer on different metal thicknesses of SPR-based sensor using FDTD
Autor: | Burhanuddin Yeop Majlis, P. Susthitha Menon, Gan Siew Mei, Nur Akmar Jamil, Najmiah Radiah Mohamad |
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Rok vydání: | 2019 |
Předmět: |
010302 applied physics
Materials science Analytical chemistry chemistry.chemical_element 02 engineering and technology Adhesion 021001 nanoscience & nanotechnology 01 natural sciences Copper Metal Chromium Full width at half maximum chemistry visual_art 0103 physical sciences visual_art.visual_art_medium Prism Surface plasmon resonance 0210 nano-technology Layer (electronics) |
Zdroj: | Materials Today: Proceedings. 7:732-737 |
ISSN: | 2214-7853 |
DOI: | 10.1016/j.matpr.2018.12.068 |
Popis: | Chromium (Cr) layer with ultrathin thickness plays significant role as adhesion layer to attach the prism with various metallic materials in a Surface Plasmon Resonance (SPR) sensor. In this research, the presence of fixed 0.5nm Cr adhesion layer has been investigated to evaluate its influence to reflectivity, resonance angle (θRes) and full-width at half maximum (FWHM) for different thickness of Gold (Au), Silver (Ag) and Copper (Cu) in the range of 20-60nm using finite-difference-time domain (FDTD) analysis. The results show the intensity of the maximum reflectivity (Rmax) decreased to 3-5% and the minimum reflection intensity (Rmin) changed from 2-14% depending on the thickness of the metallic layer. The lowest Rmin for each metals contributed by the presence of Cr adhesion layer was 6.06% 40nm Au, 11.7% 30nm Ag and 0.26% 40nm Cu. However, the resonance angle is almost same for all metals without influenced by the presence of ultrathin Cr adhesion layer. The optimum thickness of 50nm Au shows the same and highest sensitivity by 80.56°RIU for structure I and II. The FWHM increased when Cr adhesion layer exist and broadens the SPR curve. Therefore, the ultra-thin chromium layer has influenced the performance of the SPR sensor and highly dependent on the thickness of the metal. |
Databáze: | OpenAIRE |
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