Efficacy of Transistor Stacking on Flip-Flop SEU Performance at 22-nm FDSOI Node

Autor:	Zongru Li, Christopher Elash, Chen Jin, Li Chen, Shi-Jie Wen, Rita Fung, Jiesi Xing, Shuting Shi, Zhi Wu Yang, Bharat L. Bhuva
Rok vydání:	2023
Předmět:	Nuclear and High Energy Physics Nuclear Energy and Engineering Electrical and Electronic Engineering
Zdroj:	IEEE Transactions on Nuclear Science. 70:596-602
ISSN:	1558-1578 0018-9499
DOI:	10.1109/tns.2023.3257744
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::e2478c885b3bda684a94f3e4db0fcffe https://doi.org/10.1109/tns.2023.3257744 Zobrazit plný text záznamu