Application of a Differential Polarization Interferometer for Measuring of the Optical Path Length in Thin Metamaterial Layers with Reflection and Absorption Losses
Autor: | A. V. Agashkov, N. S. Kazak |
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Rok vydání: | 2019 |
Předmět: |
010302 applied physics
Materials science 010308 nuclear & particles physics business.industry Physics::Optics Metamaterial Negative index metamaterials Polarization (waves) 01 natural sciences Interferometry Wavelength Optics 0103 physical sciences business Instrumentation Laser beams Optical path length |
Zdroj: | Instruments and Experimental Techniques. 62:532-536 |
ISSN: | 1608-3180 0020-4412 |
Popis: | A differential polarization interferometer capable of correctly measuring the optical path length in thin metamaterial layers with absorption and reflection losses has been developed. As a result of direct measurement, it is shown that an Ag(28 nm)/SiO2(12 nm) binary layer deposited on a glass substrate is characterized by a negative refractive index in a wide range of incident angles of a laser beam with a wavelength of 632.8 nm. |
Databáze: | OpenAIRE |
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