Application of a Differential Polarization Interferometer for Measuring of the Optical Path Length in Thin Metamaterial Layers with Reflection and Absorption Losses

Autor:	A. V. Agashkov, N. S. Kazak
Rok vydání:	2019
Předmět:	010302 applied physics Materials science 010308 nuclear & particles physics business.industry Physics::Optics Metamaterial Negative index metamaterials Polarization (waves) 01 natural sciences Interferometry Wavelength Optics 0103 physical sciences business Instrumentation Laser beams Optical path length
Zdroj:	Instruments and Experimental Techniques. 62:532-536
ISSN:	1608-3180 0020-4412
Popis:	A differential polarization interferometer capable of correctly measuring the optical path length in thin metamaterial layers with absorption and reflection losses has been developed. As a result of direct measurement, it is shown that an Ag(28 nm)/SiO2(12 nm) binary layer deposited on a glass substrate is characterized by a negative refractive index in a wide range of incident angles of a laser beam with a wavelength of 632.8 nm.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::db9a90a1cfaeb638281723260a3ff526 https://doi.org/10.1134/s0020441219040018 Zobrazit plný text záznamu Plný text ve formátu PDF Plný text ve formátu HTML
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