Accelerating 14nm device learning and yield ramp using parallel test structures as part of a new inline parametric test strategy

Autor:	Scott McDade, Garry Moore, Bill Verzi, Jiun-Hsin Liao
Rok vydání:	2015
Předmět:	Test strategy Schedule Engineering business.industry Return on investment Test compression Macro business Simulation Electronic mail Reliability engineering Test (assessment) Parametric statistics
Zdroj:	Proceedings of the 2015 International Conference on Microelectronic Test Structures.
Popis:	This paper will look at both technical and business advantages of parallel vs. serial inline parametric testing, secondary effects of changing test strategies, quantifying return on investment of newer test strategies, and next steps in pushing the envelope of test. Topics such as cost, schedule, macro design and quality will be explored to understand tradeoffs and synergies of test strategies. Examples and metrics of parallel compared to serial testing will be examined.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::d8627a39b9d21c91310f2a0fbf9071e5 https://doi.org/10.1109/icmts.2015.7106106 Zobrazit plný text záznamu