Electrically tunable optical refractive index of a WS2 film on a SiC substrate
| Autor: | Yuke Ma, Xian-Gang Xu, Dong Wang, Yanxue Chen |
|---|---|
| Rok vydání: | 2020 |
| Předmět: |
Materials science
business.industry Optical engineering General Engineering Substrate (electronics) Atomic and Molecular Physics and Optics law.invention Pulsed laser deposition Lens (optics) chemistry.chemical_compound chemistry law Silicon carbide Optoelectronics Focal length Thin film business Refractive index |
| Zdroj: | Optical Engineering. 59:1 |
| ISSN: | 0091-3286 |
| DOI: | 10.1117/1.oe.59.1.017107 |
| Popis: | For applications in portable electronic devices and machine vision, a small sized focus-tunable lens or lens system is highly desired. Materials with electrically tunable optical refractive indices are required in these fields. A functional material consisting of a WS2 thin film on a SiC substrate was synthesized and reported in our investigation. A 15-nm-thick WS2 film was deposited on an n-doped SiC substrate (7.37 × 1019 cm − 3) by pulsed laser deposition. The optical refractive index of the WS2 / SiC material was found to be electrically tunable. The value of the effective optical refractive index ranged from 4.03 to 5.84, which implies a 44.9% variation in the refractive index change, at a wavelength of 460 nm under an applied external DC voltage modulated in the range of 0 to 7 V. We also found experimentally that the focal length of the plane lens was tunable from 184 to 156 mm at a wavelength of 650 nm with the applied voltage ranging from 0 to 7 V. Our investigation presents a new way to modulate the refractive index and make the compact focus-tunable lens design convenient. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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