Stress Relaxation in CrSi2 Crystals Grown under Microgravity Conditions from Zn Melt in the Cr–Si–Zn System
| Autor: | L. I. Derkachenko, V. N. Gurin, S. P. Nikanorov, E. V. Kalashnikov, M. A. Yagovkina |
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| Rok vydání: | 2019 |
| Předmět: |
010302 applied physics
Materials science Physics and Astronomy (miscellaneous) Thermodynamics 02 engineering and technology Crystal structure 021001 nanoscience & nanotechnology 01 natural sciences law.invention Lattice constant law 0103 physical sciences Stress relaxation Relaxation (physics) Crystallization 0210 nano-technology |
| Zdroj: | Technical Physics Letters. 45:687-689 |
| ISSN: | 1090-6533 1063-7850 |
| DOI: | 10.1134/s106378501907006x |
| Popis: | Experimental data obtained in a study of CrSi2 microcrystals grown under microgravity conditions from a Zn melt in the Cr–Si–Zn system by the mass crystallization method and then placed in terrestrial conditions are presented and analyzed. New properties of crystals of this kind are observed. |
| Databáze: | OpenAIRE |
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