| Autor: |
M.S. Dilorio, B.D. Hunt, K.-Y. Yang, J. Talvacchio, R.H. Ono, Leila R. Vale, S. Yoshizumi, Martin G. Forrester |
| Rok vydání: |
1999 |
| Předmět: |
|
| Zdroj: |
IEEE Transactions on Appiled Superconductivity. 9:3382-3385 |
| ISSN: |
1051-8223 |
| DOI: |
10.1109/77.783755 |
| Popis: |
We report on a study of long term aging in three different types of YBa/sub 2/Cu/sub 3/O/sub 7-x/ Josephson junctions. Junction aging will affect the choices made in integrating this technology with actual applications. The junction types used in this study are (a) Co-doped barrier edge SNS junctions, (b) noble-metal SNS step-edge junctions, and (c) bicrystal junctions which are either unpassivated or passivated in situ with a normal metal shunt or an epitaxial insulator. While all the junctions show degradation, for some the long term survival rate is encouraging. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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