NIST HAXPES at NSLS and NSLS-II
| Autor: | Daniel A. Fischer, B. A. Karlin, Conan Weiland, Joseph C. Woicik, Johnny P. Kirkland, Nicholas F. Quackenbush, Zugen Fu, Bruce Ravel, Eliot Gann, Cherno Jaye |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
Nuclear and High Energy Physics
Solid-state chemistry Materials science Nanotechnology 02 engineering and technology Electronic structure 021001 nanoscience & nanotechnology 01 natural sciences Atomic and Molecular Physics and Optics X-ray photoelectron spectroscopy 0103 physical sciences NIST 010306 general physics 0210 nano-technology |
| Zdroj: | Synchrotron Radiation News. 31:23-28 |
| ISSN: | 1931-7344 0894-0886 |
| Popis: | Hard X-ray photoelectron spectroscopy (HAXPES) provides numerous exciting opportunities to deepen our understanding of materials chemistry and electronic structure, as is evident from recent review... |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|