Estimation of single event effect sensitivity in VLSI to neutron irradiation

Autor:	A.I. Chumakov
Rok vydání:	2020
Předmět:	Very-large-scale integration Optics Materials science Single effect business.industry Sensitivity (control systems) Neutron irradiation business
Zdroj:	Problems of advanced micro- and nanoelectronic systems development. :153-157
ISSN:	2078-7707
DOI:	10.31114/2078-7707-2020-2-153-157
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::d3466bf3957c98113c53474ad8e8752e https://doi.org/10.31114/2078-7707-2020-2-153-157 Zobrazit plný text záznamu