Effects of Electric Field and Illumination on Implied Voc

Autor: Song, L., Lu, P.H.D., Mitchell, E., Lennon, A.J., Wenham, S.R.
Jazyk: angličtina
Rok vydání: 2012
Předmět:
DOI: 10.4229/27theupvsec2012-1cv.8.39
Popis: 27th European Photovoltaic Solar Energy Conference and Exhibition; 524-526
High quality passivation is of significant importance for high performance c-Si solar cells, while low temperature processes are also desirable for making today’s high performance solar cells. This paper explores the role of electric fields and illumination on the passivation of FZ wafers using photoconductance lifetime and capacitance-voltage (CV) measurements. It was found that an anodic aluminium oxide (AAO) film, formed on an SiNx layer by an electrochemical anodisation process, can increase the effective lifetime of the p-type FZ wafers. Experiments were performed to investigate the roles of the applied electric field and illumination on the effective lifetime of the wafers. The results of C-V measurements suggest that the increased lifetime may be due to passivation of interface states at the SiNx/Si interface.
Databáze: OpenAIRE