An efficient partial sampling inspection for lot sentencing based on process yield

Autor:	Shih-Wen Liu, Chien-Wei Wu
Rok vydání:	2023
Předmět:	General Decision Sciences Management Science and Operations Research
Zdroj:	Annals of Operations Research.
ISSN:	1572-9338 0254-5330
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::cdfeb78a850e83f86888e5e6b42c6b2f https://doi.org/10.1007/s10479-023-05341-2 Zobrazit plný text záznamu Full text from SpringerLink