Effects of particle inclusions on cracking in ultrathin barrier films
| Autor: | Kyungjin Kim, Samuel Graham, Ankit Singh, Bernard Kippelen, Xiaojia Jia, Wen-Fang Chou, Canek Fuentes-Hernandez |
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| Rok vydání: | 2020 |
| Předmět: |
010302 applied physics
Strain energy release rate Range (particle radiation) Materials science Metals and Alloys 02 engineering and technology Surfaces and Interfaces 021001 nanoscience & nanotechnology 01 natural sciences Surfaces Coatings and Films Electronic Optical and Magnetic Materials Residual stress visual_art 0103 physical sciences Ultimate tensile strength Materials Chemistry visual_art.visual_art_medium Particle Ceramic Composite material 0210 nano-technology Polyethylene naphthalate Elastic modulus |
| Zdroj: | Thin Solid Films. 714:138387 |
| ISSN: | 0040-6090 |
| Popis: | The effects of particle inclusions with different mechanical properties on the development of cracks in ultra-thin barrier films have been studied. Two types of particles, alumina and poly(styrene-b-methyl methacrylate) with large differences in their elastic modulus were used, representing both hard and soft inclusions. Particles were seeded onto polyethylene naphthalate substrates and subsequently coated with atomic layer deposited Al2O3 as a barrier film. Ca corrosion tests used to determine the performance of the barrier films revealed that soft polymer particle inclusions severely affect the development of cracking in barrier films as compared to stiff ceramic particles. Tensile tests also confirmed that the barrier films with polymer particle inclusions have the lowest value of critical onset strain. Parametric simulations, conducted by varying the elastic modulus of the particle inclusions over a wide range, resulted in a larger strain energy release rate near particle inclusions which promotes crack formation and negatively impacts the performance of barrier films with softer particle inclusions. Thus, the combination of high residual stresses in the barrier films with the presence of soft particle inclusions is found the most detrimental for the development of high-performance ultrathin barrier films. |
| Databáze: | OpenAIRE |
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