Algorithm for Second-Order Diffraction Correction in a Concave Diffraction Grating Spectrometer

Autor:	I. I. Bruchkousky, S. I. Bruchkouskaya, G. S. Litvinovich, Leonid Katkovsky
Rok vydání:	2019
Předmět:	Diffraction Physics Spectrometer business.industry Spectrum (functional analysis) Physics::Optics Condensed Matter Physics Wavelength Optics Line (geometry) business Parametrization Diffraction grating Spectroscopy Interpolation
Zdroj:	Journal of Applied Spectroscopy. 86:671-677
ISSN:	1573-8647 0021-9037
DOI:	10.1007/s10812-019-00877-3
Popis:	A feature of diffraction grating spectrometers in the visible and near IR range is that the second-order diffraction spectrum overlaps the first-order diffraction spectrum. This leads to distortions of the recorded spectrum in its long-wavelength region. We propose a method for correction of the second-order diffraction, based on representing the spectrum as the sum of Gaussians with parameters that are experimentally determined for individual wavelengths, followed by numerical interpolation. We also use parametrization of the second-order line shape. We describe the details of the experiment required, and test the performance of the method using an SSP-600N spectrometer as an example.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::ca69e868cda8c933c1b28914028e1d9b https://doi.org/10.1007/s10812-019-00877-3 Zobrazit plný text záznamu Plný text ve formátu PDF