Statistical analysis for multiple artefact problem in key comparisons with linear trends

Autor:	Nien Fan Zhang, Hung-kung Liu, William E. Strawderman, Nell Sedransk
Rok vydání:	2005
Předmět:	Statistics General Engineering Econometrics Statistical analysis Equivalence (measure theory) Mathematics
Zdroj:	Metrologia. 43:21-26
ISSN:	1681-7575 0026-1394
Popis:	A statistical analysis for key comparisons with linear trends and multiple artefacts is proposed. This is an extension of a previous paper for a single artefact. The approach has the advantage that it is consistent with the no-trend case. The uncertainties for the key comparison reference value and the degrees of equivalence are also provided. As an example, the approach is applied to key comparison CCEM–K2.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c9f941655ab3c188742ccebd8d36056e https://doi.org/10.1088/0026-1394/43/1/003 Zobrazit plný text záznamu