In-situ TEM observation of electromagnetic field in some real materials

Autor:	Tsukasa Hirayama, Hiroyasu Saka, Zhouguang Wang, Keiichi Fukunaga, Kotaro Kuroda, Katsuhiro Sasaki
Rok vydání:	2005
Předmět:	Electromagnetic field Materials science Silicon business.industry chemistry.chemical_element Dielectric Electron holography Optics chemistry Electric field Distortion Energy filtered transmission electron microscopy Particle business
Zdroj:	MRS Proceedings. 907
ISSN:	1946-4274 0272-9172
DOI:	10.1557/proc-0907-mm04-02
Popis:	Electromagnetic fields presents in some real materials have been observed using electron holography and a simple method named the Shadow Image Distortion (SID) method which we have developed. The in-situ electron holography observation of the electric field surrounding a ceramic particle showed the rapid degradation of dielectric properties of the particle at an elevated temperature. The cross sectional view of mean electrostatic potential distributions in a silicon device has been observed. In-situ electron holography and SID observations showed the electrostatic potential distribution across a reverse biased p-n junction in a compound semiconductor. The SID method using a dedicated tool allowed single-step imaging of 2D maps of electromagnetic field.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c92abce9d68be2185fc2f9d4dc3d0ab2 https://doi.org/10.1557/proc-0907-mm04-02 Zobrazit plný text záznamu Full text from SpringerLink