Test compression and hardware decompression for scan-based SoCs

Autor:	F.G. Wolff, C. Papachristou, D.R. McIntyre
Rok vydání:	2004
Zdroj:	Proceedings Design, Automation and Test in Europe Conference and Exhibition.
DOI:	10.1109/date.2004.1268945
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c79dba12ca35b169535c65158e3d3741 https://doi.org/10.1109/date.2004.1268945 Zobrazit plný text záznamu