Radio-Frequency Intensity Interrogation for Temperature Measurement

Autor:	Xiaozhong Tian, Yiping Wang, Dan Zhu, Jingzhan Shi
Rok vydání:	2022
Předmět:	Electrical and Electronic Engineering Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials
Zdroj:	IEEE Photonics Technology Letters. 34:973-976
ISSN:	1941-0174 1041-1135
DOI:	10.1109/lpt.2022.3195960
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c6dcfcea364ca5a3d49817908c59105b https://doi.org/10.1109/lpt.2022.3195960 Zobrazit plný text záznamu