Electrically Programmable Fuse (eFUSE): From Memory Redundancy to Autonomic Chips

Autor:	Norman Robson, Alberto Cestero, Alan J. Leslie, Chandrasekharan Kothandaraman, Dan Moy, R. Rajeevakumar, John M. Safran, Xiang Chen, Subramanian S. Iyer, T. Kirihata
Rok vydání:	2007
Předmět:	Authentication Engineering business.industry Embedded system Memory redundancy Fuse (electrical) Trimming IBM Chip business Analog device Computer hardware Block (data storage)
Zdroj:	CICC
Popis:	Electrical fuse (eFUSE) has become a popular choice to enable memory redundancy, chip identification and authentication, analog device trimming, and other applications. We will review the evolution and applications of electrical fuse solutions for 180 nm to 45 nm technologies at IBM, and provide some insight into future uses in 32 nm technology and beyond with the eFUSE as a building block for the autonomic chip of the future.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c6b08ecafec5e9cdecee455157c2da3c https://doi.org/10.1109/cicc.2007.4405850 Zobrazit plný text záznamu