Switching Field and Resolution of MFM Tips Prepared by Coating Fe/Co50Pt50 Magnetic Films

Autor:	Nobuyuki Inaba, Fumiyoshi Kirino, Mitsuru Ohtake, Yuma Tomita, Masaaki Futamoto
Rok vydání:	2017
Předmět:	History Materials science Field (physics) business.industry Resolution (electron density) Radius engineering.material Computer Science Applications Education Magnetization Coating engineering Optoelectronics Magnetic force microscope business Layer (electronics) Image resolution
Zdroj:	Journal of Physics: Conference Series. 903:012009
ISSN:	1742-6596 1742-6588
DOI:	10.1088/1742-6596/903/1/012009
Popis:	Magnetic force microscope (MFM) tips are prepared by coating Fe(10 nm)/Co50Pt50(x nm)/Ru(5 nm) (at. %) films at 300 °C on Si-base tips of 4 nm radius. The thickness of CoPt layer, x, is varied in a range of 10 – 200 nm. The effects of coating thickness on spatial resolution and switching field of MFM tip are investigated. With increasing the thickness, the resolution deteriorates from 9.4 to 12.1 nm. The switching field increases from 0.675 to 2.025 kOe with increasing the coating thickness from 10 to 200 nm. A tip prepared by coating 100 nm thick Co50Pt50 film which has high resolution and high switching field property is successfully applied to the observation of magnetization structure of high-K u magnetic thin film with L10-ordered structure.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c4febcb67c3743813a12ff4166ab49bd https://doi.org/10.1088/1742-6596/903/1/012009 Zobrazit plný text záznamu