Autor:	Yu. V. Eremeev, V. D. Sadkov, A. B. Ivanov
Rok vydání:	2010
Předmět:	Optics law business.industry Telecommunications engineering Conformal map Electrical and Electronic Engineering Resistor Laser Chip business Mathematics law.invention
Zdroj:	Radioelectronics and Communications Systems. 53:48-51
ISSN:	1934-8061 0735-2727
Popis:	Using conformal mapping method there is obtained analytical relations for form-factor and its dependence on depth of laser slit for accurate alignment elements in form of semicircular, triangle and rectangular chamfered regions in precision film and metal-foil chip-resistors.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c3ae38e4a35b0cafafbdbf4605152f9c https://doi.org/10.3103/s0735272710010085 Zobrazit plný text záznamu Full text from SpringerLink