Effect of self-assembled monolayer film order on nanofriction

Autor:	Daniel A. Fischer, Shuchen Hsieh, Stephen M. Hsu, Sharadha Sambasivan
Rok vydání:	2006
Předmět:	Materials science Extended X-ray absorption fine structure Monolayer Analytical chemistry Infrared spectroscopy Self-assembled monolayer Surfaces and Interfaces Fourier transform infrared spectroscopy Thin film Condensed Matter Physics Spectroscopy XANES Surfaces Coatings and Films
Zdroj:	Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 24:1484-1488
ISSN:	1520-8559 0734-2101
Popis:	Self-assembled monolayers have increasingly been explored as potential protective films in devices against friction and adhesion. However, detailed characterization of the monolayer film structure is difficult. This article utilizes a combination of near edge x-ray absorption fine structure (NEXAFS) spectroscopy and Fourier transform infrared (FTIR) spectroscopy to determine the film structure in order to explain the observed nanofriction measurement results. A series of n-alkyltrichlorosilane self-assembled monolayer films with various chain lengths (C5–C30) was prepared on silicon (100) surfaces. Nanofriction measurements were conducted using an atomic force microscope. Results showed that the lowest friction was obtained with a C12 film with higher friction values observed for C5 and C30 films. To explain these observations, the x-ray absorption technique NEXAFS was used to quantitatively measure the surface molecular orientation (order) of these films. It was observed that C12, C16, and C18 films were...
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::c2dcbda04e9641bf6bdb390ee88588f7 https://doi.org/10.1116/1.2204920 Zobrazit plný text záznamu