Resistive Pulse Sensing as a High‐Resolution Nanoparticle Sizing Method: A Comparative Study

Autor:	Soma Papp, Szilvia Berényi, Péter Terejánszky, Róbert E. Gyurcsányi
Rok vydání:	2019
Předmět:	Resistive touchscreen Materials science business.industry Resolution (electron density) Nanoparticle tracking analysis Nanoparticle General Chemistry Condensed Matter Physics Sizing Pulse (physics) Dynamic light scattering Optoelectronics General Materials Science business
Zdroj:	Particle & Particle Systems Characterization. 36:1800543
ISSN:	1521-4117 0934-0866
DOI:	10.1002/ppsc.201800543
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::be76d683d5966d9b9813dddce94f9764 https://doi.org/10.1002/ppsc.201800543 Zobrazit plný text záznamu Plný text