Image processing in the material science or fractal behaviour on the GaAs/electrolyte interface

Autor:	Péter Turmezei, A. Nemesics, M. Schuszter, L. Dobos
Rok vydání:	2008
Předmět:	Box counting Fractal Materials science business.industry Etching (microfabrication) Scanning electron microscope Digital image processing Surface roughness Optoelectronics Pattern formation Image processing business
Zdroj:	2008 6th International Symposium on Intelligent Systems and Informatics.
Popis:	Here, pattern formation on GaAs (001) surface after electrochemical layer removal with the help of image processing was investigated. The morphology of GaAs surface shown fractal behaviour under non-selective etching conditions. The morphological surface study was carried out using digital image processing of scanning electron microscope data. The surface patterns were segmented by the so called grade of membership method. Fractal properties were established using the box counting method.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::be5b74ca40e32e3044cc785b6dc3d8a7 https://doi.org/10.1109/sisy.2008.4664942 Zobrazit plný text záznamu