Crystal structure of GeTe and Ge2Sb2Te5 meta-stable phase

Autor:	Toshihisa Nonaka, Yuji Mori, Gentaro Ohbayashi, Yoshiharu Toriumi, Hideki Hashimoto
Rok vydání:	2000
Předmět:	Diffraction Chemistry Metals and Alloys Surfaces and Interfaces Crystal structure Cubic crystal system Surfaces Coatings and Films Electronic Optical and Magnetic Materials law.invention Crystal Phase change Crystallography law Optical recording Materials Chemistry Crystallization Optical disc
Zdroj:	Thin Solid Films. 370:258-261
ISSN:	0040-6090
DOI:	10.1016/s0040-6090(99)01090-1
Popis:	Direct X-ray diffraction measurement of the erased state of the Ge–Sb–Te recording layer in a four-layered phase change optical disk, which was produced by an optical disk drive, was performed. It was identified as an fcc crystal structure. In order to carry out the detailed crystal structure analysis by the powder X-ray diffraction method with Rietveld refinements, somewhat larger amount of the fcc crystal powder was prepared from deposited 10 μm thick films. It revealed that Ge2Sb2Te5 belongs to the NaCl type structure (Fm3m) with the 4a site including 20% vacancies. The conclusion was supported by the results of the density measurements with Grazing Incidence of X-ray Reflectivity.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::be18fc4a2f3f10536727823e1253273f https://doi.org/10.1016/s0040-6090(99)01090-1 Zobrazit plný text záznamu Full Text from ScienceDirect