Characterization of InGaAs/GaAs(001) films grown by metalorganic vapor phase epitaxy using alternative sources
| Autor: | M. J. Kappers, K. T. Higa, H. Yoon, Mark S. Goorsky, Robert F. Hicks, Byung-Kwon Han, Lian Li |
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| Rok vydání: | 1998 |
| Předmět: |
Diffraction
Chemistry Analytical chemistry Nucleation Condensed Matter Physics Epitaxy Electronic Optical and Magnetic Materials law.invention law Hall effect Materials Chemistry Metalorganic vapour phase epitaxy Electrical and Electronic Engineering Thin film Scanning tunneling microscope Solid solution |
| Zdroj: | Journal of Electronic Materials. 27:81-84 |
| ISSN: | 1543-186X 0361-5235 |
| Popis: | Thin films of InxGa1−xAs (0 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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