Defect Identification in Large Area Electronic Backplanes
| Autor: | Steve Ready, Rene A. Lujan, Michael Yu Tak Young, R. A. Street, William S. Wong, Sanjiv Sambandan, Raj B. Apte, Beverly Russo |
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| Rok vydání: | 2009 |
| Předmět: |
Pixel
business.industry Computer science Transistor ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION Electrical engineering Feedthrough Hardware_PERFORMANCEANDRELIABILITY Condensed Matter Physics Electronic Optical and Magnetic Materials law.invention Active matrix Capacitor Backplane law Thin-film transistor Logic gate Optoelectronics Electrical and Electronic Engineering business |
| Zdroj: | Journal of Display Technology. 5:27-33 |
| ISSN: | 1551-319X |
| DOI: | 10.1109/jdt.2008.2004858 |
| Popis: | We describe a rapid testing system for active matrix thin-film transistor (TFT) backplanes which enables the identification of many common processing defects. The technique spatially maps the charge feedthrough from TFTs in the pixel and is suited for pixels with switched-capacitor architecture. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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