The Fault Diagnosis of Analog Circuits Based on Extension Theory
Autor: | Meng-Hui Wang, Yu-Kuo Chung, Wen-Tsai Sung |
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Rok vydání: | 2009 |
Předmět: | |
Zdroj: | Emerging Intelligent Computing Technology and Applications ISBN: 9783642040696 ICIC (1) |
Popis: | This paper proposed a new fault diagnosis method based on the extension theory for analog circuits. The responses of an analog circuit were difference at some node with the normal and failure conditions. However, the identification of the faulted location was not easily task due to the variability of circuit components. So this paper presented a novel extension method for fault diagnosis of analog circuit, which is based on the matter-element model and extended relation functions. The proposed method has been tested on a practical analog circuit, and compared with the multilayer neural network (MNN) based methods and k-means classification method. The application of this new method to some testing cases has given promising results. |
Databáze: | OpenAIRE |
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