A new BICS for CMOS operational amplifiers by using oscillation test techniques
| Autor: | Jordi Font, Rodrigo Picos, Miquel Roca, Eugeni Isern, Eugeni Garcia-Moreno |
|---|---|
| Rok vydání: | 2003 |
| Předmět: |
Engineering
business.industry Transconductance General Engineering Electrical engineering Hardware_PERFORMANCEANDRELIABILITY law.invention Amplitude Gate oxide law Operational transconductance amplifier Fault coverage Hardware_INTEGRATEDCIRCUITS Operational amplifier Electronic engineering Current sensor Sensitivity (control systems) business |
| Zdroj: | Microelectronics Journal. 34:919-926 |
| ISSN: | 0026-2692 |
| DOI: | 10.1016/s0026-2692(03)00158-7 |
| Popis: | In this paper, we present a built-in current sensor to test operational amplifiers that takes advantage of previous results where the negative supply current has been taken as the test observable using the Oscillation-test technique. The sensor is applied to a variable-length chain of OTAs considering an exhaustive analysis of catastrophic defects (opens, shorts), Gate Oxide Short and Floating Gate defects. We analyse the sensitivity of both frequency and amplitude of the current consumption. Results show that the proposed sensor provides 97% fault coverage, as the previous results suggested. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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