Improvements in AFM imaging of the spatial variation of force - distance curves: on-line images
| Autor: | C. Frediani, B. Cappella, Paolo Baschieri, Cesare Ascoli, P. Miccoli |
|---|---|
| Rok vydání: | 1997 |
| Předmět: |
Cantilever
Materials science Silicon business.industry Lift (data mining) Atomic force microscopy Mechanical Engineering chemistry.chemical_element Stiffness Bioengineering General Chemistry Grating Optics chemistry Mechanics of Materials medicine General Materials Science Spatial variability Electrical and Electronic Engineering medicine.symptom business |
| Zdroj: | Nanotechnology. 8:82-87 |
| ISSN: | 1361-6528 0957-4484 |
| Popis: | A new scanning method, `touch and lift', aimed to improve the simultaneous acquisition of topography and force - distance curves on each point of the scanned surface, is presented. This method does not damage the sample or the cantilever and enables us to collect a lot of data in a relatively short time. Its most important feature is that data are directly organized in `force-slices', i.e. images giving immediate qualitative information on the physico-chemical structure of the sample. We present and discuss such images for two samples: a fluorescein isothyocyanate grating on silicon in air and a peroxidase grating on silicon in water, measuring the spatial variation of stiffness, attractive forces and adhesion in both cases. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|