HIGHLIGHTING OF TWO TYPES OF DEFECTS IN 1300 nm PBC LASER DIODES

Autor:	B. Bauduin, D. Riviere, J. Wallon, J. Y. Boulaire
Rok vydání:	1996
Předmět:	Materials science genetic structures business.industry Optical power Management Science and Operations Research Laser eye diseases law.invention Active layer Optical microscope law Electronic engineering Optoelectronics sense organs Safety Risk Reliability and Quality business Diode
Zdroj:	Quality and Reliability Engineering International. 12:317-320
ISSN:	1099-1638 0748-8017
DOI:	10.1002/(sici)1099-1638(199607)12:4<317::aid-qre29>3.0.co;2-b
Popis:	Laser diodes of PBC (p-substrate buried crescent) structure and emitting at 1300nm, were subjected to calibrated electrostatic discharges (ESD). A failure analysis was then set up using a scanning optical microscope (SOM) and has allowed the localization of the damaged zones. The comparison of the results obtained with the electro-optical characteristics has highlighted two types of complementary defects : (i) a so-called optical type defect, since the optical power is significantly reduced, although leakage current has not occurred (active layer seriously damaged) ; (ii) a so-called electrical type defect, since the leakage current increases, although the optical power is barely reduced (active layer weakly damaged).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b4d7b9ff07c823e912691fb469418a3b https://doi.org/10.1002/(sici)1099-1638(199607)12:4<317::aid-qre29>3.0.co Zobrazit plný text záznamu Plný text