Temperature dependence of the coefficient of linear thermal expansion of single-crystal SmS
| Autor: | S. M. Solov’ev, Z. M. Omarov, L. N. Vasil’ev, S. M. Luguev, N. V. Sharenkova, V. V. Kaminskiĭ, A. V. Golubkov |
|---|---|
| Rok vydání: | 2007 |
| Předmět: |
Diffraction
Materials science Thermodynamics Atmospheric temperature range Condensed Matter Physics Computer Science::Computers and Society Atomic and Molecular Physics and Optics Thermal expansion Computer Science::Other Electronic Optical and Magnetic Materials Metal Crystallography visual_art Lattice (order) X-ray crystallography visual_art.visual_art_medium Single crystal |
| Zdroj: | Semiconductors. 41:1-4 |
| ISSN: | 1090-6479 1063-7826 |
| DOI: | 10.1134/s1063782607010010 |
| Popis: | The coefficient of linear thermal expansion of single-crystal SmS has been measured in the temperature range 300–850 K by dilatometry and X-ray diffraction. It is shown that the difference in the results obtained by these two methods is due to the heating-induced formation of SmS phases with small lattice parameters (5.62–5.8 A) close to that for the metallic SmS phase. |
| Databáze: | OpenAIRE |
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