Propagation of Current-Induced Stacking Faults and Forward Voltage Degradation in 4H-SiC PiN Diodes
| Autor: | Steve Arthur, Larry Burton Rowland, Robert E. Stahlbush, Jeffery B. Fedison, Shao Ping Wang, James W. Kretchmer |
|---|---|
| Rok vydání: | 2002 |
| Předmět: |
Materials science
business.industry Mechanical Engineering PIN diode Stacking Electroluminescence Forward voltage Condensed Matter Physics law.invention Mechanics of Materials law Electronic engineering Optoelectronics General Materials Science Current (fluid) business Stacking fault Degradation (telecommunications) |
| Zdroj: | Materials Science Forum. :427-430 |
| ISSN: | 1662-9752 |
| DOI: | 10.4028/www.scientific.net/msf.389-393.427 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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