Failure Analysis of AlGaN/GaN Power HEMTs through an innovative sample preparation approach

Autor:	R. L. Torrisi, S. Adamo, S. Alessandrino, C. Bottari, B. Carbone, M. Palmisciano, E. Vitanza
Rok vydání:	2022
Zdroj:	2022 IEEE International Reliability Physics Symposium (IRPS).
DOI:	10.1109/irps48227.2022.9764513
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::b3852162913ce61d07ddd6223861bbe1 https://doi.org/10.1109/irps48227.2022.9764513 Zobrazit plný text záznamu