Optical and electrical properties of V2O5 nanorod films grown using an electron beam
| Autor: | Sok Won Kim, Ji-Wook Ryu, Minwoo Chu, Manil Kang |
|---|---|
| Rok vydání: | 2013 |
| Předmět: |
Diffraction
Materials science Photoluminescence business.industry Transition temperature Metals and Alloys Analytical chemistry Surfaces and Interfaces Surfaces Coatings and Films Electronic Optical and Magnetic Materials Crystallinity Materials Chemistry Cathode ray Optoelectronics Orthorhombic crystal system Nanorod business Sheet resistance |
| Zdroj: | Thin Solid Films. 547:198-201 |
| ISSN: | 0040-6090 |
| DOI: | 10.1016/j.tsf.2013.03.060 |
| Popis: | An electron beam irradiation method is suggested for growing V 2 O 5 nanorods. V 2 O 5 nanorods with an orthorhombic structure (α-V 2 O 5 ) were well grown by electron beam irradiation and the nanorod growth was greatly enhanced by inserting a buffer layer. The X-ray diffraction pattern of V 2 O 5 nanorods grown at a dose rate of 800 kGy considerably changed due to an increase in structural inhomogeneity formed by vanadyl–oxygen vacancies. The transition temperature increased due to the increasing surface resistance and was steeply enhanced by the increase in crystallinity with growing nanorods. Two photoluminescence peaks were observed at 530 nm and 710 nm for the V 2 O 5 nanorods grown at a dose rate of 800 kGy due to oxygen vacancies and a band edge transition. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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