Raman scattering in diamond irradiated with high-energy xenon ions
| Autor: | N. Kazuchits, Olga V. Korolik, M.S. Rusetsky, N.S. Kirilkin, V.A. Skuratov, V.N. Kazuchits |
|---|---|
| Rok vydání: | 2020 |
| Předmět: |
Nuclear and High Energy Physics
Materials science Analytical chemistry Diamond chemistry.chemical_element 02 engineering and technology engineering.material 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences Ion symbols.namesake Full width at half maximum Ion implantation Xenon chemistry symbols engineering Radiation damage Irradiation 0210 nano-technology Instrumentation Raman scattering |
| Zdroj: | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 472:19-23 |
| ISSN: | 0168-583X |
| DOI: | 10.1016/j.nimb.2020.03.034 |
| Popis: | Accumulation of radiation damage and associated mechanical stresses in diamonds irradiated with 167 MeV Xe ions to fluences 1.0 × 1010 ÷ 8.15 × 1014 cm−2 have been studied using confocal Raman spectroscopy. The spectra were measured in a backscattering geometry across the irradiated layer by scanning the edge of single crystalline synthetic samples with nitrogen concentration 3 ÷ 5 ppm. All spectra were recorded at room temperature. Parameters of the 1332 cm−1 first-order Raman line – the FWHM and peak position, studied as function of Xe ion fluence, were used to characterize the structural disorder and mechanical stress level. |
| Databáze: | OpenAIRE |
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