Analysis of the hysteresis in theI‐Vcharacteristics of vertically integrated, multipeaked resonant‐tunneling diodes
Autor: | Dave Shupe, Robert C. Potter, Hung C. Lin, Tai-Haur Kuo |
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Rok vydání: | 1990 |
Předmět: | |
Zdroj: | Journal of Applied Physics. 68:2496-2498 |
ISSN: | 1089-7550 0021-8979 |
DOI: | 10.1063/1.346513 |
Popis: | The hysteresis (extrinsic) and current‐voltage (I‐V) characteristics of the multiwell, vertically integrated, resonant‐tunneling diode are analyzed. Our analysis shows that hysteresis in the vertically integrated diode I‐V can result from interchanging the order in which the devices switch, depending if the bias is increasing or decreasing. Experimental results are presented that support this analysis. |
Databáze: | OpenAIRE |
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