Analysis of the hysteresis in theI‐Vcharacteristics of vertically integrated, multipeaked resonant‐tunneling diodes

Autor: Dave Shupe, Robert C. Potter, Hung C. Lin, Tai-Haur Kuo
Rok vydání: 1990
Předmět:
Zdroj: Journal of Applied Physics. 68:2496-2498
ISSN: 1089-7550
0021-8979
DOI: 10.1063/1.346513
Popis: The hysteresis (extrinsic) and current‐voltage (I‐V) characteristics of the multiwell, vertically integrated, resonant‐tunneling diode are analyzed. Our analysis shows that hysteresis in the vertically integrated diode I‐V can result from interchanging the order in which the devices switch, depending if the bias is increasing or decreasing. Experimental results are presented that support this analysis.
Databáze: OpenAIRE