Systematic Characterization of Dual Probes for Electromagnetic Near-Field Measurement

Autor:	Huang Yun, Yun-lei Shi, Yuandong Guo, Rongquan Chen, Lu Guoguang, Xiao He, Shao Weiheng, Ping Lai, Lei Wang, Xinxin Tian, Yunfei En, Fang Wenxiao
Rok vydání:	2021
Předmět:	Physics Frequency response Electromagnetics Field (physics) business.industry 010401 analytical chemistry Near and far field 01 natural sciences Microstrip 0104 chemical sciences Magnetic field Optics Electric field Device under test Electrical and Electronic Engineering business Instrumentation
Zdroj:	IEEE Sensors Journal. 21:4713-4722
ISSN:	2379-9153 1530-437X
DOI:	10.1109/jsen.2020.3034255
Popis:	In this paper, systematic characterization of the dual probe, which is designed for the near field simultaneous measurement of both electric and magnetic field, is investigated with a microstrip line as the device under test (DUT). The characterization includes frequency response, transmission performance, symmetry, reflection, the intrusion of probe to the DUT, isolation of electric and magnetic field responses, field profile and spatial resolution, and differential electric field suppression. The dual probes with different design are adopted to demonstrate the systematic characterization.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a9e082ab89278811211efbe4b2710535 https://doi.org/10.1109/jsen.2020.3034255 Zobrazit plný text záznamu