Effective Switching Probability Calculation to Locate Hotspots in Logic Circuits

Autor:	Taiki Utsunomiya, Ryu Hoshino, Kohei Miyase, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara
Rok vydání:	2022
Zdroj:	2022 IEEE International Test Conference in Asia (ITC-Asia).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a86150189895fb808cd5bf3dff20dc01 https://doi.org/10.1109/itcasia55616.2022.00018 Zobrazit plný text záznamu