Determination of the electron distribution in thin barrier AlGaAs/GaAs superlattices by capacitance-voltage profiling

Autor:	E.I. Vasilkova, E.V. Pirogov, M.S. Sobolev, A.I. Baranov, A.S. Gudovskikh, A.D. Bouravleuv
Rok vydání:	2022
Předmět:	Mechanical Engineering Atomic and Molecular Physics and Optics Computer Science Applications Information Systems Electronic Optical and Magnetic Materials
Zdroj:	Scientific and Technical Journal of Information Technologies, Mechanics and Optics. 22:1092-1097
ISSN:	2226-1494
DOI:	10.17586/2226-1494-2022-22-6-1092-1097
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a72551f68c51bbde3ea67238a4abd52d https://doi.org/10.17586/2226-1494-2022-22-6-1092-1097 Zobrazit plný text záznamu