In situ monitoring of thermal transitions in thin polymeric films via optical interferometry
| Autor: | Constantinos D. Diakoumakos, Ioannis Raptis |
|---|---|
| Rok vydání: | 2003 |
| Předmět: |
chemistry.chemical_classification
Materials science Polymers and Plastics Organic Chemistry technology industry and agriculture Analytical chemistry macromolecular substances Polymer Methacrylate Interferometry chemistry.chemical_compound chemistry Polymer chemistry Materials Chemistry Melting point Wafer Thin film Methyl methacrylate Glass transition |
| Zdroj: | Polymer. 44:251-260 |
| ISSN: | 0032-3861 |
| Popis: | A novel, low-cost, rapid, accurate, non-invasive and high throughput method based on the principles of Optical Interferometry (OPTI method) has been developed and applied for the in situ monitoring in one simple run of first (melting) and second (glass transition) order transitions as well as of the thermally induced decomposition of various thin polymeric films spin coated on flat reflective substrates (untreated silicon wafers). The new method has been applied successfully for measuring the glass transition, melting and decomposition temperatures of six commercially available polymers [poly(methyl methacrylate) (PMMA), poly(2-hydroxyethyl methacrylate), (PHEMA), poly(vinyl acetate-co-crotonic acid), (PVACA), poly(vinyl pyrrolidone) (PVP), poly(vinyl chloride-co-vinyl acetate) (PVCVA) and crystalline poly(vinylidene fluoride-co-hexafluoropropylene) (PVFHP)] of known Tgs or Tms. The recorded interferometric signals were identified and characteristic signal patterns were qualitatively correlated to specific transitions. The monitoring of first and second order transitions in thin polymeric films is based on detectable differentiations of the total energy of a fixed wavelength laser beam incident almost vertically (angle of incidence |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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