A microRaman study of the structural properties of PLD high Tc superconducting thin films
| Autor: | C. Belouet, Sergio Nicoletti, D. Chambonnet, P. Martin, S. Degoy, L. Correra, O. Martinez, J. Jiménez, A.C. Prieto |
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| Rok vydání: | 1996 |
| Předmět: |
Diffraction
Materials science Superconducting thin films Analytical chemistry Energy Engineering and Power Technology Condensed Matter Physics Electronic Optical and Magnetic Materials Pulsed laser deposition symbols.namesake Nuclear magnetic resonance symbols Electrical and Electronic Engineering Thin film Spectroscopy Raman spectroscopy Grain orientation Stoichiometry |
| Zdroj: | Physica C: Superconductivity. 270:144-154 |
| ISSN: | 0921-4534 |
| Popis: | YBCO thin films grown by PLD (Pulsed Laser Deposition) are studied by microRaman spectroscopy. The results reveal a high degree of structural inhomogeneity, that is analyzed in terms of different causes: stoichiometry failures, both oxygen and cationic, strain, preferred orientation of the grains, disorder, defects. The influence that these structural features can have on the Raman spectrum is discussed. Complementary measurements of X-ray diffraction and Rutherford backscattering spectroscopy were carried out in order to support the stoichiometric and grain orientation data deduced from Raman spectroscopy. On the basis of the results presented herein, we can conclude that microRaman spectroscopy is a powerful tool for the assessment of thin film structural properties, although an extrapolation of the Raman data obtained for YBCO single crystals must be handled with care in thin films. |
| Databáze: | OpenAIRE |
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