Parametrization of a Microwave and the Noise Model of a Metamorphic 0.15 µm MHET InAlAs/InGaAs Transistor
| Autor: | N. I. Kargin, I. S. Vasilievsky, Konstantin S. Grishakov, A. A. Gorelov, R. V. Ryzhuk, V. V. Lokotko |
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| Rok vydání: | 2021 |
| Předmět: |
Materials science
business.industry Transistor Condensed Matter Physics Noise figure Capacitance Electronic Optical and Magnetic Materials law.invention Inductance Parasitic capacitance law Materials Chemistry Optoelectronics Electrical and Electronic Engineering business Parametrization Noise (radio) Microwave |
| Zdroj: | Russian Microelectronics. 50:170-177 |
| ISSN: | 1608-3415 1063-7397 |
| Popis: | AlGaAs MHEMT transistors are studied in the microwave frequency range with a gate length of 0.15 μm. It is found that the discrepancy between the experimental and theoretically calculated, within the model, S-parameters does not exceed 0.5% in the frequency range from 1 to 30 GHz. The static characteristics of the device are satisfactorily described by the indicated model in the voltage range of the runoff up to 2.5 V. For the analysis of the noise characteristics, the Fukui model is used. It is found that the influence of the parasitic drain capacitance and the values of the drain and source inductances do not significantly affect the noise characteristics of the transistor, and an increase in the parasitic capacitance and a decrease in the parasitic gate inductance can lead to a significant reduction in the high-frequency noise figure. |
| Databáze: | OpenAIRE |
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