Measurements with a 35-psec gate time microchannel plate camera

Autor:	Roy L. Hanks, Perry M. Bell, J. D. Kilkenny, Otto Landen
Rok vydání:	1991
Předmět:	Physics Optics Microchannel business.industry High-speed photography X-ray detector Microchannel plate detector Semiconductor device business Aspect ratio (image) Particle detector Electronic circuit
Zdroj:	Ultrahigh- and High-Speed Photography, Videography, Photonics, and Velocimetry '90.
ISSN:	0277-786X
DOI:	10.1117/12.23371
Popis:	Measurements of the x-ray gate time of 0.2 mm thick microchannel plates with an L/D aspect ratio of 20 as opposed to the more usual L/D=40, demonstrate that gate times of 35 ps can be achieved. Good agreement with time dependent modelling is demonstrated. 7 refs., 4 figs., 2 tabs.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a1e2f48aafae1857ef371e9080cbb21a https://doi.org/10.1117/12.23371 Zobrazit plný text záznamu