The Effects of the External Conditions of CMOS IC Functioning on Latchup Occurrence under Uniform Laser Irradiation

Autor:	D. V. Bobrovskiy, I. I. Shvetsov-Shilovskiy, Alexander I. Chumakov, Alexander A. Pechenkin
Rok vydání:	2021
Předmět:	Random access memory Materials science business.industry ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION Hardware_PERFORMANCEANDRELIABILITY Integrated circuit Laser Power (physics) law.invention Capacitor CMOS law Hardware_INTEGRATEDCIRCUITS Optoelectronics Irradiation business Voltage
Zdroj:	2021 IEEE 32nd International Conference on Microelectronics (MIEL).
DOI:	10.1109/miel52794.2021.9569126
Popis:	The paper concerns experimental results on external conditions such as temperature, voltage supply, current limit, and features of the power circuit on latchup occurrence under uniform laser irradiation.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a17d718edfbdc3e82874918df9f5cd0f https://doi.org/10.1109/miel52794.2021.9569126 Zobrazit plný text záznamu