Effect of ion beam patterning on the write and read performance of perpendicular granular recording media

Autor:	Charles T. Rettner, B. D. Terris, Margaret Evans Best, Andreas Moser, J. Lohau
Rok vydání:	2001
Předmět:	Physics Magnetic domain Ion beam business.industry Phase (waves) Perpendicular recording Focused ion beam Electronic Optical and Magnetic Materials Optics Perpendicular Electrical and Electronic Engineering Single domain business Jitter
Zdroj:	IEEE Transactions on Magnetics. 37:1652-1656
ISSN:	0018-9464
DOI:	10.1109/20.950928
Popis:	We have used a static write-read tester to study the reading and writing of bit patterns on arrays of square bits cut with a focused ion beam into granular perpendicular recording media. We have written square-wave bit patterns on arrays of magnetically isolated islands with periods between 80-248 nm, with the recording linear density matched to this pattern period. These measurements clearly reveal the onset of single domain behavior of the islands for periods
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9dbaccb3357ba7de308d7158b4e331d5 https://doi.org/10.1109/20.950928 Zobrazit plný text záznamu