Motion Artefact Detection in Structured Illumination Microscopy

Autor: Aurélie Jost, Ronny Förster, Rainer Heintzmann, Walter Müller, Kai Wicker
Rok vydání: 2016
Předmět:
Zdroj: Frontiers in Optics 2016.
DOI: 10.1364/fio.2016.fth4c.3
Popis: The necessary image processing in structured illumination microscopy generates high resolution artefacts if the sample has moved during the acquisition. Our algorithm locates motion and distinguishes artefacts from real high resolution cell features.
Databáze: OpenAIRE