Analysis of grain orientation and intergrain properties by micro-Raman spectroscopy in YBa2Cu3O7−x thin films

Autor:	C. Belouet, D. Chambonnet, Omar S. Martinez, Juan Jiménez
Rok vydání:	2000
Předmět:	Superconductivity Materials science Mechanical Engineering Condensed Matter Physics Epitaxy symbols.namesake Mechanics of Materials Homogeneity (physics) symbols General Materials Science Grain boundary Thin film Composite material Raman spectroscopy Spectroscopy Deposition (law)
Zdroj:	Journal of Materials Research. 15:1069-1075
ISSN:	2044-5326 0884-2914
Popis:	Superconducting YBa2Cu3O7−x (YBCO) thin films grown by pulser-laser-assisted deposition were studied by micro-Raman spectroscopy. This technique was used to estimate the epitaxial quality of the films in terms of the presence of c-axis- and a-axis-oriented areas. The advantage of micro-Raman spectroscopy is its high lateral resolution, and this was used to study the homogeneity of the films at submicrometric level. Local structural changes from a large number of intergrain regions were revealed by changes of the Raman parameters. For example, the aggregation of a-axis-oriented grains formed needle-shaped macrograins. Micro-Raman measurements suggest that these grains were seeded at large-angle grain boundaries in c-axis-oriented areas.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9b1a1fd986e9163112ab0e666b9a8429 https://doi.org/10.1557/jmr.2000.0154 Zobrazit plný text záznamu Full text from SpringerLink