MTBRD analysis of fail-safe systems
| Autor: | Zhibang Zhou |
|---|---|
| Rok vydání: | 1988 |
| Předmět: |
Engineering
business.industry System recovery Process (computing) Condensed Matter Physics Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Reliability engineering Safe operation Kernel (statistics) Fail-safe Electrical and Electronic Engineering Safety Risk Reliability and Quality business Algorithm |
| Zdroj: | Microelectronics Reliability. 28:857-860 |
| ISSN: | 0026-2714 |
| DOI: | 10.1016/0026-2714(88)90281-8 |
| Popis: | In this paper, on the basis of a general model, an important index of fail-safe (FS) systems—MTBRD (mean time between system recovery from a dangerous-side failed status and the next dangerous failure)—is to be defined, and the effect of changing Q—the kernel of the semi-Markov process which describes the status of an FS system—on MTBRD are evaluated. From these analytical results, three measures for weighing the effectiveness of an FS technique can be defined, by which the system designers are able to quantitatively analyze the effects of the adopted FS techniques on safe operation. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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