Distributed testing of a device-level interface specification for a metrology system

Autor:	John Horst, Thomas Kramer, Keith Stouffer, Joseph Falco, Hui-Min Huang, Frederick Proctor, Albert Wavering
Rok vydání:	2002
DOI:	10.6028/nist.ir.6851
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::96a2dc80e9396e24480760e251686c0e https://doi.org/10.6028/nist.ir.6851 Zobrazit plný text záznamu